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Home >> Products >> CERAMIC HIGH RELIABILITY OPTOCOUPLERS >> HIGH GAIN PHOTON OPTOCOUPLERS >> Product Detail
Products
CH350
 
  • Circuit and Package
  • Features
  • Description
  • Datasheet
  • Absolute Maximum Ratings
  • Electrical Characteristics
  • Reliability and Approvals
  • Similar Optocouplers
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Circuit and Package
Circuit
Package
Features
 
  •  Release to IECQ-CECC
  •  Hermetically Sealed
  •  High Density Packaging
  •  1500V DC withstand Test Voltage
  •  Low Input Requirements
  •  High Current Transfer Ratio
  •  RoHS Compliant
Description
  The CH350 is a single channel device sealed in a small outline ceramic package suitable for mounting in hybrid sub-assemblies. It incorporates a high radiance LED and a high gain integrated photodetector. The output is an open collector Schottky clamped transistor.
Datasheet
 
Absolute Maximum Ratings (Ta=25°C)
 
Storage Temerature -65°C to +150°C
Operating Temperature -55°C to +125°C
Lead Soldering Temperature 260C for 10S, 1.6mm below seating plane where appropriate

Input Diode
Peak Forward Current 40mA IF (< 1mS duration)
Average Forward Current 20mA IF
Reverse Voltage 5V VR 
Power Dissipation 35mW  

Output Transistor
Supply Voltage 7V VCC (1 minute maximum)
Current 25mA IO
Collector Power Dissipation 40mW  
Voltage 7V VO
 
Electro-optical Characteristics
 
TA = -55°C to +125°C U.O.S.
All typical values at VCC = 5V, TA = 25°C (each channel where appropriate).
Parameter Symbol Test Conditions Min Type Max Units
High Level Output Current
(See notes 1)
IOH
IF = 250µA, VO = VCC = 5.5V - 20
250 
µA 
Lower Level Output Voltage
(See note 1 & 9)
VOL IF = 10mA,  VCC = 5.5V, IOL(sinking) = 10mA, - 0.4  0.6  V 
High Level Supply Current ICCH  VCC = 5.5V, IF1 =  IF2 = 0 - 15 30
mA 
Low Level Supply Current
ICCL VCC = 5.5V, IF1 =  IF2 = 13mA - 15  36 mA 
Input-Output Insulation Leakage Current
(See notes 2 & 10)
II-O 
RH = 45%, TA = 25°C, t = 5S
VIO = 1500Vdc
-  -  1.0 
µA 
Input Forward Voltage
(See note 1)
VF  IF = 10mA, TA = 25°C - 1.5  1.9  V 
IF = 20mA - -  1.9 
Input Reverse Breakdown Voltage
(See note 1)
BVR IR = 10µA, TA = 25°C 5 -  -  V 
Propagation Delay Time
to High Output Level 
(See note 1 & 5)
tPLH
RL = 510Ω, IF = 13mA,
TA = 25°C, CL = 15pF
-  - 200  nS
Propagation Delay Time
to Low Output Level 
(See note 1 & 6)
tPHL 
RL = 510Ω, IF = 13mA,
TA = 25°C, CL = 15pF
-  -  200  nS
Current Transfer Ratio
CTR  IF = 10mA, VO = 0.6V, VCC = 5.5V  100  - -  %
 
Typical Characteristics
TA = 25°C
Parameter Symbol  Test Conditions  Notes  Min  Type  Max  Units 
Input Diode Temperature
Coefficient
ΔVF
ΔTA
IF = 20mA 1  -  -1.9  -  mV/°C 
Resistance RI-O  V10 = 500V

3

-  1012  - Ω
Capacitance CI-O  f = 1MHz  3 -  1.9  -  pF 
Input Capacitance CIN  f = 1MHz, VF = 0  1  - 60  -  pF
Input-Input
Leakage Current
II-I 
45% Relative Humidity
VII = 500Vdc, t = 5S
4  -  0.5 -  nA 
Resistance  RI-I VII = 500Vdc  4  -  1012  -  Ω
Capacitance CI-I  f = 1MHz  4 - 0.6 - pF
Output Rise (10-90%) tr

RL = 510Ω, CL = 15pF, IF = 13mA

1 - 35 - nS
Output Fall Time (90-10%) tf RL = 510Ω, CL = 15pF, IF = 13mA 1 - 35 - nS
Common Mode Transient Immunity at Logic High Output Level CMH 
VO (min) = 2V, VCM = 10V (peak)
RL = 510Ω, IF = 0mA
1 & 7  -  1000  -  V/µS
Common Mode Transient Immunity at Logic Low Output Level CML
VO (max) = 0.8V, VCM = 10V (peak)
RL = 510Ω, IF = 10mA
1 & 8  -  1000  -  V/µS
Notes: (Apply typically to 16 pin package) 
1.  Each channel, where appropriate.
2.  Measured between pins 1 through 4 shorted together, and pins 9 through 16 shorted together.
3.  Measured between pins 1 and 2, or 5 and 6 shorted together, and pins 9 through 16 shorted together.
4.  Measured between pins 1 and 2 shorted together, and pins 5 and 6 shorted together.
5.  The tPLH propagation delay is measured from the 6.5mA point on the trailing edge of the input pulse to the 1.5V point on the trailing edge of the output pulse.
6.  The tPHL propagation delay is measured from the 6.5mA point on the leading edge of the input pulse to the 1.5V point on the leading edge of the output pulse.
7.  CMH is the maximum tolerable common mode transient to assure that the output will remain in a high logic state (i.e., VO > 2.0V).
8.  CML is the maximum tolerable common mode transient to assure that the output will remain in the logic low state (i.e., VO < 2.0V).
9.  It is essential that a bypass capacitor (0.1 to 0.1µF, ceramic) be connected from pin 10 to pin 15. Total lead length between both ends of the capacitor and the isolator pins should not exceed 20mm.
10. This is a momentary withstand test, not an operating condition.
Reliability and Approvals
 

IECQ-CECC_Certification

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